Crystallographic Control of Core-Shell Nanowire Bending and Twisting
How the spontaneous bending and twisting of a semiconductor core-shell nanowire is governed by the crystallographic orientation of the shell-deposition beam relative to the wire's hexagonal side facets, rather than by shell amount alone. Established through scanning and transmission electron microscopy of GaAs-InP nanowires and a hexagonal-facet electron-tomography reconstruction of the shell distribution, showing that facet-relative deposition geometry is an engineering control for shaping out-of-plane nanowire sensors.
Electron Microscopy Study of Core–Shell Nanowire Bending and Twisting Spencer McDermott, Trevor R.
An electron-microscopy study of GaAs-InP core-shell semiconductor nanowires that spontaneously bend and twist when their outer shell is deposited asymmetrically. Using scanning and transmission elect…