Time-Dependent Dielectric Breakdown in Gate Oxides
A gate oxide held below its instantaneous breakdown voltage still accumulates damage until it shorts, so voltage derating buys life rather than merely avoiding immediate destruction. It is the mechanism that makes 'it works at rated voltage' an inadequate reliability argument.
This Concept is waiting for its first lesson!
A gate oxide held below its instantaneous breakdown voltage still accumulates damage until it shorts, so voltage derating buys life rather than merely avoiding immediate destruction. It is the mechanism that makes 'it works at rated voltage' an inadequate reliability argument.
Are you a teacher? Sign in to start contributing.
Sign In