Conceptual

TReCiM: Temperature-Resilient Multibit 2FeFET-1T Compute-in-Memory Design

A temperature-resilient, multibit 2FeFET-1T compute-in-memory cell that adds a MOSFET clamp exploiting the transistor's complementary-to-absolute-temperature (CTAT) characteristic to cancel subthreshold-FeFET temperature drift from 0 to 85 C while using FeFET multi-level-cell states for multibit multiply-accumulate at array scale.