graph LR
    idea_06fe0a9e_7470_46ba_a91c_aad1b28253fd["Thermal Design and Component Placement for Cooling"]
    idea_0935a883_fbc1_4313_8023_7694febe2b07["Bathtub Curve of Infant Mortality, Useful Life and Wear-Out"]
    idea_0bc97679_7ad4_439f_b58f_4924ef2937d5["Coffin-Manson Model for Thermal Cycling Fatigue"]
    idea_15ce2fb7_e74b_4593_bab3_3a88e885f1e4["Qualification Testing Versus Production Screening"]
    idea_17dac972_9087_4184_a6d5_52fb9fe18b65["Standby Redundancy and Switchover Reliability"]
    idea_22e69b4e_10fc_4cec_ad68_50117aa0f59b["Common-Cause Failure Limits on Redundancy"]
    idea_2615b5df_2f05_4304_bd8d_35f21cccd5dd["Worst-Case Circuit Analysis Over Tolerance and Temperature"]
    idea_31bf15dc_e9eb_4405_93ef_0e994ed69e7e["Test-Analyze-and-Fix Reliability Growth"]
    idea_364fef77_24bb_4db2_a7c0_a3e00f769348["FMEA and FMECA for Electronic Assemblies"]
    idea_3ec19a8a_0a2b_4d20_8ee5_3f2b924351d9["Physics of Failure Versus Handbook Reliability Prediction"]
    idea_43c9ce65_e0f6_40a7_be01_c56f769c9c97["Failure Definition and Failure Criteria in Reliability Engineering"]
    idea_47c67711_b6b3_4cf3_9e88_d7338943eb9a["Spares Provisioning and Operational Availability"]
    idea_4d8da8b5_b2e4_4b75_a7d0_38890265b9c0["ESD and Electrical Overstress Damage in Electronics"]
    idea_50c86d77_c251_4450_95b5_35f3f0bc4690["Distinguishing MTBF from Useful Life in Reliability Claims"]
    idea_58a7fd0f_140f_4404_97f2_b6a1b9cb6889["Ohm's Law"]
    idea_59a56e82_b06a_422e_9105_942f8ed13846["Multiplying Probabilities of Independent Events in Probability"]
    idea_605605fd_8287_44d5_8e54_40e047271a17["Tin Whisker Growth on Lead-Free Surface Finishes"]
    idea_6dfb96a6_9998_433f_9f9a_d85e1f49340c["HALT to Find Operating and Destruct Limits"]
    idea_71a538b8_7978_41bf_b566_bccaa1ac96b9["Probability Density Function"]
    idea_73621d29_6f87_4e42_bcdc_92a9e41ac3ba["Arrhenius Equation"]
    idea_75b98245_10bf_496d_8760_2852180895ca["MIL-HDBK-217 Parts Count Failure Rate Prediction"]
    idea_78ef8f11_fdbf_45b8_a81f_342eb05ef155["Duane Model for Reliability Growth Tracking"]
    idea_79ac2940_a51b_4f82_bafd_5270078d2ed8["Parts and Materials Selection Control in Electronics"]
    idea_7b0f67b5_4780_4591_8ec0_015ce28bd335["Derating Electronic Components Below Rated Limits"]
    idea_7c155e3b_0f06_4618_8fb1_287dfa60ef5b["Censored and Suspended Units in Life Test Data"]
    idea_8683c306_8b1d_45d9_862d_df3d990bc9d3["HASS as a Production Screen Derived from HALT"]
    idea_8812be03_12fd_4d4a_8519_90bc24810ecb["Incoming Inspection and Rescreening of Semiconductor Lots"]
    idea_9e9dae6f_ed89_4080_b4a3_ffe1403c5ef9["k-of-n Voting Redundancy in Fault-Tolerant Electronics"]
    idea_a25d52c7_a359_4b8c_aaaa_fe279588d7e1["Environmental Stress Screening with Thermal Cycling and Random Vibration"]
    idea_a91585f8_971d_4d37_9b68_5adf150fc07c["Transition from Development to Production Risk Templates"]
    idea_a94c498b_c969_42d5_bd65_b40e830ef08f["Electromigration in Integrated Circuit Interconnects"]
    idea_aec8a4bd_50ae_4046_8f8b_659573bc11b6["Time-Dependent Dielectric Breakdown in Gate Oxides"]
    idea_af8fa9ff_62bb_48cc_a829_d8c5aa096bb5["Design Reference Mission Profile as a Reliability Requirement"]
    idea_b27a0b98_0f12_4afa_b5a6_446f64b4fae8["Junction Temperature Limits in Semiconductor Design"]
    idea_b32c4edf_6c9e_4f47_9410_668c13dd123a["Active Parallel Redundancy in Electronic Systems"]
    idea_bc7c52ed_8154_4b9a_b66c_7d527aa19340["Weibull Distribution and the Shape Parameter β"]
    idea_bd5ba9d8_2b2e_417a_bd5e_0e3919fad304["Constant Failure Rate λ and the Exponential Life Model"]
    idea_c1cf2aa8_e7d3_4999_99a9_af41005b0d1b["Fault Tree Analysis and Minimal Cut Sets"]
    idea_c97b270b_be29_4ec6_ba22_11f4487ff518["MTBF and MTTF as the Reciprocal of Failure Rate"]
    idea_caeb1572_875a_4a14_a0f5_2a445ae99495["Build-to-Print Workmanship Control in Electronics Manufacturing"]
    idea_cb8646f2_d7b0_438b_84f6_fddc62c48fe0["Reliability Block Diagrams for System Modelling"]
    idea_fe97a343_666a_41e6_93ec_79d6913f2d7a["Availability from MTBF and Mean Time to Repair"]
    idea_ff77831c_788a_40d6_a8ba_7bfb1539a169["Weibull Probability Plotting and Median Rank Regression"]
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    idea_b32c4edf_6c9e_4f47_9410_668c13dd123a --> idea_22e69b4e_10fc_4cec_ad68_50117aa0f59b
    idea_71a538b8_7978_41bf_b566_bccaa1ac96b9 --> idea_2615b5df_2f05_4304_bd8d_35f21cccd5dd
    idea_43c9ce65_e0f6_40a7_be01_c56f769c9c97 --> idea_364fef77_24bb_4db2_a7c0_a3e00f769348
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    idea_a25d52c7_a359_4b8c_aaaa_fe279588d7e1 --> idea_8683c306_8b1d_45d9_862d_df3d990bc9d3
    idea_31bf15dc_e9eb_4405_93ef_0e994ed69e7e --> idea_78ef8f11_fdbf_45b8_a81f_342eb05ef155
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    idea_2615b5df_2f05_4304_bd8d_35f21cccd5dd --> idea_06fe0a9e_7470_46ba_a91c_aad1b28253fd
    idea_8812be03_12fd_4d4a_8519_90bc24810ecb --> idea_a91585f8_971d_4d37_9b68_5adf150fc07c
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    idea_7b0f67b5_4780_4591_8ec0_015ce28bd335 --> idea_2615b5df_2f05_4304_bd8d_35f21cccd5dd
    idea_b27a0b98_0f12_4afa_b5a6_446f64b4fae8 --> idea_06fe0a9e_7470_46ba_a91c_aad1b28253fd
    idea_bc7c52ed_8154_4b9a_b66c_7d527aa19340 --> idea_ff77831c_788a_40d6_a8ba_7bfb1539a169
    idea_79ac2940_a51b_4f82_bafd_5270078d2ed8 --> idea_605605fd_8287_44d5_8e54_40e047271a17
    idea_31bf15dc_e9eb_4405_93ef_0e994ed69e7e --> idea_a91585f8_971d_4d37_9b68_5adf150fc07c
    idea_af8fa9ff_62bb_48cc_a829_d8c5aa096bb5 --> idea_364fef77_24bb_4db2_a7c0_a3e00f769348
    idea_b32c4edf_6c9e_4f47_9410_668c13dd123a --> idea_9e9dae6f_ed89_4080_b4a3_ffe1403c5ef9
    idea_bd5ba9d8_2b2e_417a_bd5e_0e3919fad304 --> idea_78ef8f11_fdbf_45b8_a81f_342eb05ef155
    idea_c97b270b_be29_4ec6_ba22_11f4487ff518 --> idea_50c86d77_c251_4450_95b5_35f3f0bc4690
    idea_0935a883_fbc1_4313_8023_7694febe2b07 --> idea_50c86d77_c251_4450_95b5_35f3f0bc4690
    idea_59a56e82_b06a_422e_9105_942f8ed13846 --> idea_c1cf2aa8_e7d3_4999_99a9_af41005b0d1b
    idea_73621d29_6f87_4e42_bcdc_92a9e41ac3ba --> idea_a94c498b_c969_42d5_bd65_b40e830ef08f
    idea_6dfb96a6_9998_433f_9f9a_d85e1f49340c --> idea_8683c306_8b1d_45d9_862d_df3d990bc9d3
    idea_fe97a343_666a_41e6_93ec_79d6913f2d7a --> idea_47c67711_b6b3_4cf3_9e88_d7338943eb9a
    idea_15ce2fb7_e74b_4593_bab3_3a88e885f1e4 --> idea_a91585f8_971d_4d37_9b68_5adf150fc07c
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